spea-3030
- 產品名稱：spea-3030
- 產品型號：spea-3030
- 產品廠商：spea
- 產品文檔：
spea-3030
的詳細介紹| spea-3030 |
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Productivity
3030 represents the newest platform for the in-circuit test currently on the market. It is based on the most advanced technologies now available, and is developed to reach the highest productivity.
MULTIPLE ENGINE. 3030’s exclusive, fully modular and scalable architecture, allows the housing of multiple tester instrumentation in the same test system. Each test engine is equipped with a powerful independent control unit, so that the system can perform the true concurrent test on several boards.
PARALLEL TEST. 3030 can simultaneously test several boards, utilizing just one fixture. The various possible parallel test configurations allow you to match the test time you need, according to the highest-throughput lines. It is possible to test in parallel several boards of the same panel, as well as several single boards, even different from each other.
SPEED. 3030’s instrumentation is extremely fast, thanks to the architecture based on distributed intelligence. Each instrument has independent control unit (CPU) and local memory, so that the test execution is independent from the system computer.
MULTI-FUNCTION TEST. 3030 can perform on the boards – in the same session and simultaneously – multiple test techniques, from in-circuit to functional test to on-board programming. In this way, it is not required to use several dedicated workstations along the production line.
Scalability
With spea-3030 , SPEA has further enhanced the architecture for the electronic board testing.
Several models, open HW and SW Multiple Engine architecture, modular instrumentation, and a variety of interfaces and fixture receivers. 3030 is fully configurable, to answer any production and budget requirement. You can combine the fault coverage you need with the complexity and characteristics of your product, the fault spectrum, the test strategy. And you can, at any moment, integrate and extend your 3030 directly in the factory, to update it to the highest performance level meeting your ever-changing test requirements.
From the simple process test to the most complex multi-function test, integrating several techniques and instruments, 3030 configuration is simple yet effective.
The PerPin architecture – that makes all the analog and digital resources and the guards always available on each system channel – is a time-saving solution. It is possible to start the fixture design and build even without the test program ready, and the ECO changes can be directly handled with ease.
Migration
Would you like to replace your old bed-of-nail systems, but the investment seems exaggerated? Are you worried about loosing all your existing fixtures and test programs? Do you think the migration to a new test system would require time and resources that will weigh on your production?
Pass to 3030! The system is designed to guarantee the highest compatibility with other test systems, making the migration from different test platform an easy and fast operation.
3030’s flexible interface allows you to keep using your existing fixtures and adapters manufactured by other suppliers. SPEA, Tecnost, Tescon, Seica, Zenthel, Teradyne, HP, Agilent, Genrad: whatever your fixture, you keep using it.
With Leonardo Migration Pack, you can convert your test programs with minimum effort. The test program migration is an automated sequence of operations that does not require specific knowledge. The refining operations are minimum, made easy by Leonardo’s AutoDebug tools.
If the migration is from one of SPEA’s Easytest or Unitest system, the compatibility is complete: you can reuse test programs and fixtures without any adaptation and above all, without conversions.
Save on time with 3030
SMOOTH INTEGRATION
3030’s factory integration is fast and straightforward. Channels and instrumentation are integrated in a compact footprint, and the installation is easy. The system is quickly ready to work, and it is Energy Saving Compliant: 3030 just requires the monophase AC supply, without compressed air or vacuum, and it will enter in stand-by mode automatically.
ADAPTABILITY
The variety of receivers and interfaces allows you to use 3030 either in manual mode or integrated in-line. 3030 is designed for an immediate integration in automated production lines: the in-line receiver is quickly set up, and the system can be also equipped with a wide range of automation units: buffers, conveyors, loaders, and unloaders will allow you to meet your line requirements.
PRODUCTIVITY
The very high productivity makes 3030 able to respect your line’s beat rate, even if it is the fastest: you can use a smaller number of testers, drastically lowering the cost of test while saving on floor encumbrance. And the saving will last during the whole life of the system: 3030’s main uptime is close to 99%, and the cost-of-ownership is extremely low.
Fixtures
Once the test program has been generated, the next step consist in fixture design and build.
sepa-3030 fixtures are low cost and fast to be developed and built. They are easy to be assembled, light, ergonomic, and guarantee high signal integrity and contact accuracy, thanks to the wireless interface technology. The high-density design allows the use of compact fixtures also for boards with thousands of nets. The test points can be distributed on both sides of the board, without significant cost increasing.
This simplifies the integration in-line or with automation units. 3030’s flexible interface makes it possible to use the in-line fixtures also on systems with manual receivers, featuring a great versatility in use.
Testing with sepa-3030 is accurate, fast, and flexible. The powerful precise instrumentation, that is able to reach a fault coverage close to 100%, can be composed and configured to answer virtually any test requirement, from the process test to complex digital and multi-function tests, with the possibility to apply power (line voltage – 220/110 VAC -, DC, active or passive loads, power matrix, discharger…) and perform complete functional tests.
The available test techniques go much further than the simple in-circuit test, extending the diagnostic capability to the detection of those latent faults that typically take effect only in the field. Test techniques that stress the single component, dynamic tests, and structural tests, allow the detection of faults before they can show their effects during the first working period.
With sepa-3030field returns will not be a worry.
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On Board Programming
Board programming station after testing is no more required with 3030 systems. OBP can load board specific test functions (BIST and BOST), but it can also be used to load product operating software. In this way it is possible not to have an external programming station, avoiding risks due to board handling after testing. Through special commands, the test system supplies voltages, control signals, addresses and data in order to reset and program the component. Specific connectors (for example JTAG) or traditional bed-of-nail spring probes can be used for programming. |
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Open Pin Scan The increasing volume of electronic components on a board can result in an increase of process defects, starting from the lack of solder on the component pins. The introduction of the BGA technology limits the use of the optical inspection, but it can be efficiently substituted with the Open Pin Scan technique. 3030 systems can use three different test techniques to identify structural board defects, such as open pins:
- Electro Scan, based on the measurement of the electrical field emitted by a pin connected to its net The combined use of the three techniques brings together the effective analysis of defects regardless of the circuit configuration and the component technology. With the Open Pin Scan techniques, it is possible to find other structural defects on the tested board, such as polarized capacitors and integrated circuits reverse polarity, connectors mounted incorrectly, RF capacitors presence (stray capacitors). |
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Boundary Scan Testing devices that have no physical access presents no problem to the 3030.
Using the boundary scan technique, the system is capable of testing electronic boards of high integrity and high complexity (or boards with accessibility limits), checking the pins and their interconnection integrity even without probe contact. With SPEA In-Boundary Scan you can also program and/or test memories and programmable components (such as EPLD, CPLD, …) via the JTAG bus, even if they are not boundary scan compliant. |
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Power Test 3030 can be equipped to execute power functional tests. The system enables executing on board all the measurements required for the functional test of power devices after the In-Circuit or parametric test: converters, power supplies, generators, power drivers. 3030 system enables parameterizing the product functional testing, checking its correct operation in a range of line voltages (up to 400 VAC/40 A and up to 600 VDC/40 A), and active and reactive loads.
Test reliability is ensured by readbacks, which verify that all the generated and measured parameters are coherent with what is required for testing.
- Programmable AC (single-phase or three-phase) and DC (bipolar and unipolar) generators The system and its instrumentation are conceived and realized to testing the latest low voltage power boards and modules. The functional testing of generators and AC-DC or DC-DC converters, able to generate low voltage (3.3-0.5 V) and supply high current (many dozens of Ampère) is executed with very high accuracy. |
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Optical Test 3030 OPT is designed to perform a simple and economic optical inspection of the boards, in addition to the in-circuit and functional test. The system, that is fully modular, can be composed in order to satisfy specific requirements without using a high-performance, expensive AOI system designed for other aims.
The system can be, for instance, used to perform a selective optical inspection (aimed at specific aspects or areas of the board), satisfying the need to execute an optical check of the operations done after SMD assembly. In this way, the boards that are carried out to the parametric/functional test are free from those defects that are not detectable by electronic test equipment: inverted component polarization, wrong LEDs color, unfinished dissipater assembly, presence/absence of added components and mechanical parts, faulty soldering.
- base unit type (in-line, bench top, stand alone) |
